Mat-1.3656 Seminar on
numerical analysis and computational science
Monday, Jan 24, 2011, room
U322 at 14.15, Eirola & Stenberg
Nuutti Hyvönen,
Backscattering in electrical impedance tomography
Electrical impedance tomography is an imaging technique for recovering
the admittance inside a body from boundary measurements of current and
voltage. In the special case that the measurement probe is
(infinitesimally) small, consists of two electrodes and can be moved
along the object boundary, the available data are of backscatter nature.
We note that in the two-dimensional setting such measurements uniquely
determine an insulating simply connected cavity in constant background.
Moreover, we present an algorithm for localizing more general compactly
supported inhomogeneities by reconstructing the so-called convex
backscattering support. This talk describes joint work with Martin Hanke
and Stefanie Reusswig (Mainz).